Spectro Spectrometer In Thane

Mobility

Benchtop

Brand

Raman

Model Name/Number

Foundry Master Expert

Sensitivity

superior accuracy

Mobility

Benchtop

Brand

Hitachi

Model Name/Number

FT160

Material

Fiber

Model Series

RS-125

Type

nuclear radiation

Excitation Source

SPECTROMETRIC

Mount Type

Portable

Display Type

LED

Material

IP54

Usage/Application

Industrial

Brand

ATOMTEX

General purpose energy dispersive x-ray fluorescence spectrometer BRA-135F allows to simultaneously detect about two tens of chemical elements during 300 sec maximum over a wide concentration range from hundreds of ppb. BRA-135F analyses samples in solid, liquid and powder state as well as samples marked on the surface or deposited on the filters.

Stand Alone Spectrometer System A robust 1U server computer is implemented inside of the JNM-ECZ spectrometer itself, and working as stand-alone. Linear Magnetic Field Gradient Function ECZS 40.7% volume of ECS

The JTS-10 is a LED pump-probe spectrometer designed for electron transfer studies in photosynthetic organisms via fluorescence and absorbance changes. Using external and removable actinic LEDs to excite the sample and detecting LEDs to follow the electron transfer at specific wavelenght, the JTS-10 covers a wide range of applications.

Model Series

eMission 2

Excitation Source

Spark OES

Mount Type

Benchtop

Optical System

Single Beam

Model Series

M5

Mount Type

Benchtop

Analysis Type

All Metals

Matrix Type

Aluminium, Copper, Titanium, Steel, Cast Iron, Nickel

Brand

Spectra Analytical

Voltage

310V

Frequency

50 Hz

Series

2100

Foundry-Master Xpert Spectometers

Portable Spectrometer testing

Brand

Spectro

Optical System

Single Beam

WE DO CHEMICAL TESTING BY SPECTROMETER ALONG WITH GRADE CONFIRMATION

Model Name/Number

Nanoptic 90

Usage/ Application

Laboratory Use

Country of Origin

Made in India

Components

High quality components

The 2830 ZT wavelength dispersive X-ray fluorescence (WDXRF) wafer analyzer offers the ultimate capability for measuring film thickness and composition. Designed specifically for the semiconductor and data storage industry, PANalytical s 2830 ZT Wafer Analyzer enables the determination of layer composition, thickness, dopant levels and surface unif

The spectrometer is intended for determining element contents in the range of Na to U in the substances in the solid, powdery, dissolved state and deposited on the surface of or deposited on the filters. The operating principle of the X-ray spectrometer is based on irradiating a sample X-ray tube the primary radiation, the intensity of the secondar

Spectrometer

Wdxrf Spectrometer

GDS-850A GDS500